• Title of article

    Highly reliable dc SQUIDs in temperature with laser-MBE YBa2Cu3OX thin films

  • Author/Authors

    Wang، نويسنده , , Jing and Han، نويسنده , , Bing and Chen، نويسنده , , Fan and Zhao، نويسنده , , Tong and Xu، نويسنده , , Fengzhi and Zhou، نويسنده , , Yueliang and Chen، نويسنده , , Genghua and Lu، نويسنده , , Huibin and Yang، نويسنده , , Qiansheng and Cui، نويسنده , , Tianhong، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2003
  • Pages
    4
  • From page
    431
  • To page
    434
  • Abstract
    Highly reliable dc superconducting quantum interference devices (SQUIDs) in temperature with step edge junctions (SEJs) were fabricated with laser molecular beam epitaxy (L-MBE) YBa2Cu3OX thin films. The reflection high-energy electron diffraction oscillation cycles proved that the superconducting films were epitaxially grown on the atomic scale. In the dc SQUID temperature transition curves, the tail structures appear at a temperature close to the transition point. The critical current dependent temperature, IC∼(1−T/TC)2, shows that the L-MBE SEJ behaves like an SNS type junction. The white noise level, 2.0×10−5Φ0/Hz at 200 Hz, triangular wave signal, critical current and other characteristics exhibit no change after 42 temperature cycles and 108 days of storage.
  • Keywords
    A. YBCO , D. Reliability , B. MBE , A. dc SQUID
  • Journal title
    Solid State Communications
  • Serial Year
    2003
  • Journal title
    Solid State Communications
  • Record number

    1787980