• Title of article

    Temperature dependence of absorption edge anisotropy in 2H- MoSe2 layered semiconductors

  • Author/Authors

    Hu، نويسنده , , S.Y. and Lee، نويسنده , , Catherine Y.C and Shen، نويسنده , , J.L. and Chen، نويسنده , , K.W. and Tiong، نويسنده , , K.K and Huang، نويسنده , , Y.S.، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2006
  • Pages
    5
  • From page
    176
  • To page
    180
  • Abstract
    The absorption-edge anisotropy of 2H- MoSe2 was studied by photoconductivity (PC) measurements as a function of temperature in the range of 12–300 K. A significant shift towards lower energies has been observed in the PC spectra on the edge plane with respect to those corresponding to the van der Waals (VdW) plane. The parameters that describe the temperature dependence of the absorption edges are evaluated by the Bose–Einstein empirical expression. Effective phonon energy was estimated from the temperature dependence of the Urbach energy. The estimated effective phonon energy for the VdW and edge planes, respectively, can be correlated to the observed Raman active E 1g and A 1g modes.
  • Keywords
    D. Photoconductivity , A. Semiconductors
  • Journal title
    Solid State Communications
  • Serial Year
    2006
  • Journal title
    Solid State Communications
  • Record number

    1790921