Title of article
Frictional force detection from lateral force microscopic image using a Si grating
Author/Authors
Hong، نويسنده , , D.K. and Han، نويسنده , , S.A. and Park، نويسنده , , Philip J.H. and Tan، نويسنده , , Soon Huat and Lee، نويسنده , , Naesung and Seo، نويسنده , , Yongho، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2008
Pages
4
From page
567
To page
570
Abstract
We present a simple method to calibrate frictional force from lateral force and topographic images using a commercial scanning probe microscope. A standard sample of Si grating and commercial Si cantilever were used in this study. We have measured the frictional force between the Si tip and functionalized multi-wall carbon nanotube bundles using our calibration method.
Keywords
Scanning probe microscopy , Lateral force microscopy , Calibration , Frictional force
Journal title
Colloids and Surfaces A Physicochemical and Engineering Aspects
Serial Year
2008
Journal title
Colloids and Surfaces A Physicochemical and Engineering Aspects
Record number
1795993
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