• Title of article

    The measurement of nitrogen ion species ratio in inductively coupled plasma source ion implantation

  • Author/Authors

    Cho، نويسنده , , Jeonghee and Han، نويسنده , , Seunghee and Lee، نويسنده , , Yeonhee and Kim، نويسنده , , Ok Kyung and Kim، نويسنده , , Gon-Ho and Kim، نويسنده , , Young-Woo and Lim، نويسنده , , Hyuneui and Suh، نويسنده , , Moojin Choi، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2001
  • Pages
    5
  • From page
    106
  • To page
    110
  • Abstract
    The internal inductively coupled nitrogen plasma was studied to find optimum conditions of ion species ratio in plasma source ion implantation processes. The ratio of nitrogen ion species, i.e. N2+ and N+, was measured with quadrupole mass analyzer (QMA) and a single Langmuir probe. The results of QMA and a single Langmuir probe measurement showed very good agreement and it was shown that a single Langmuir probe could be used to measure the ion species ratio easily. For the confirmation of the measured ion species ratio, nitrogen ions were implanted into Si wafer and scanning Auger analysis was performed to investigate the depth distribution of implanted nitrogen ions.
  • Keywords
    Langmuir Probe , Ion species , Nitrogen plasma , QMA , Ion ratio , Plasma source ion implantation
  • Journal title
    Surface and Coatings Technology
  • Serial Year
    2001
  • Journal title
    Surface and Coatings Technology
  • Record number

    1800634