• Title of article

    RF plasma deposition of SiO2-like films: plasma phase diagnostics and gas barrier film properties optimisation

  • Author/Authors

    Creatore، نويسنده , , Mariadriana and Palumbo، نويسنده , , Fabio and dʹAgostino، نويسنده , , Riccardo and Fayet، نويسنده , , Pierre، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2001
  • Pages
    6
  • From page
    163
  • To page
    168
  • Abstract
    Hexamethyldisiloxane/oxygen fed radiofrequency glow discharges have been utilised for the deposition onto polyethyleneterephtalate of transparent silicon dioxide-like films with barrier properties to oxygen. The complexity of such plasma phases and the increasing interest shown for the industrial deposition process of barrier films have led the authors to investigate Fourier transform infrared absorption spectroscopy as a plasma technique for better understanding of the deposition mechanism and the development of a process control useful for scaling up. The above mentioned technique has shown its potential in the correlation of plasma phase chemistry with the barrier properties of the SiOx coated polymer, especially when very good performances are required (OTR≤3 cm3/m2 day atm).
  • Keywords
    FTIR technique , Gas barrier films , Process control , PECVD
  • Journal title
    Surface and Coatings Technology
  • Serial Year
    2001
  • Journal title
    Surface and Coatings Technology
  • Record number

    1801413