Title of article
RF plasma deposition of SiO2-like films: plasma phase diagnostics and gas barrier film properties optimisation
Author/Authors
Creatore، نويسنده , , Mariadriana and Palumbo، نويسنده , , Fabio and dʹAgostino، نويسنده , , Riccardo and Fayet، نويسنده , , Pierre، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
6
From page
163
To page
168
Abstract
Hexamethyldisiloxane/oxygen fed radiofrequency glow discharges have been utilised for the deposition onto polyethyleneterephtalate of transparent silicon dioxide-like films with barrier properties to oxygen. The complexity of such plasma phases and the increasing interest shown for the industrial deposition process of barrier films have led the authors to investigate Fourier transform infrared absorption spectroscopy as a plasma technique for better understanding of the deposition mechanism and the development of a process control useful for scaling up. The above mentioned technique has shown its potential in the correlation of plasma phase chemistry with the barrier properties of the SiOx coated polymer, especially when very good performances are required (OTR≤3 cm3/m2 day atm).
Keywords
FTIR technique , Gas barrier films , Process control , PECVD
Journal title
Surface and Coatings Technology
Serial Year
2001
Journal title
Surface and Coatings Technology
Record number
1801413
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