Title of article
PAC study of Ni-irradiated Sb films
Author/Authors
Zofia Szweykowska-Kulinska، نويسنده , , A and Lieb، نويسنده , , K.-P and Uhrmacher، نويسنده , , M and Wodniecki، نويسنده , , P، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
3
From page
225
To page
227
Abstract
The Perturbed Angular Correlation method with 111In tracers was applied to investigate the influence of implanted nickel impurities on the electric field gradient (EFG) in antimony films. A very strong dependence of EFG at low Ni concentrations was found. Ni implantations and thermal annealings did not destroy the texture produced during the deposition of the Sb films on Si (100) substrates.
Keywords
Peturbed angular correlation , 111In , Sb film , Ni implantation
Journal title
Surface and Coatings Technology
Serial Year
2002
Journal title
Surface and Coatings Technology
Record number
1804200
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