Title of article
Concentration profiles of ion exchanged optical waveguides in glass: analysed in hollow cathode plasma
Author/Authors
Djulgerova، نويسنده , , R. and Pantchev، نويسنده , , B. and Mihailov، نويسنده , , V. and Gencheva، نويسنده , , V. and Flaga، نويسنده , , J.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
5
From page
201
To page
205
Abstract
In this study the possibility of hollow cathode discharge for depth profiling of optical waveguides is demonstrated. Planar optical waveguides fabricated by Ag+–Na+ and K+–Na+ ion exchange processes in glasses are studied. The depth profiles of ion concentrations in these optical waveguides are determined by layer-by-layer emission spectral analysis in hollow cathode plasma. The results agree with ion concentration profiles obtained by method based on refractive index profiles.
Keywords
Glow discharge sputtering , Optical waveguides , depth profiling , Hollow cathode discharge
Journal title
Surface and Coatings Technology
Serial Year
2003
Journal title
Surface and Coatings Technology
Record number
1805258
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