Title of article
AFM study of LaNiO3 thin films on various single crystal substrates prepared by using a metal naphthenate precursor
Author/Authors
Hwang، نويسنده , , Kyu-Seog and Kang، نويسنده , , Bo-An and Jeon، نويسنده , , Young-Sun and An، نويسنده , , Jun-Hyung and Kim، نويسنده , , Byung-Hoon and Nishio، نويسنده , , Keishi and Tsuchiya، نويسنده , , Toshio، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
5
From page
331
To page
335
Abstract
We investigated surface morphology of LaNiO3 thin films on LaAlO3 (100), SrTiO3(100), MgO(100) and sapphire (0001) substrates by using atomic force microscope (AFM). Chemical solution deposition process was adopted to prepare thin film with a metal naphthenate precursor. The power spectral density of thin films on LaAlO3 and SrTiO3 substrates exhibits an inflated shape at a spatial frequency into 10 μm−1 range with uniformly formed small grains, while LaNiO3 on sapphire showed a high root mean square roughness.
Keywords
LaNiO3 thin film , Power Spectral Density , Atomic Force Microscope
Journal title
Surface and Coatings Technology
Serial Year
2005
Journal title
Surface and Coatings Technology
Record number
1809004
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