XPS, EPMA and microstructural analysis of a defective industrial plasma-nitrided steel

A multiple analysis of a defective nitrided case has been used to investigate different parts of the over layer region. Experiments by means of X-ray photoelectron spectroscopy (XPS), electron probe microanalysis (EPMA), light microscopy and microhardness measurements were done at different scales and information was given on the structural and physico-chemical properties. tallographic study allowed estimating the nitrided case depth together with hardness and nitrogen concentration profiles in depth. Also, the irregular nitrogen concentration and the irregular hardness profiles, in a parallel direction to the surface, were correlated with the structure features in the nitrided sample cross-section. n notice a reasonable connection among the different results, which gives a good understanding of the defective nitrided sample.