Title of article
Electrophoretically deposited alumina as protective overlay for thermal barrier coatings against CMAS degradation
Author/Authors
Mohan، نويسنده , , P. and Yao، نويسنده , , B. and Patterson، نويسنده , , R. S. T. M. Sohn، نويسنده , , Y.H.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2009
Pages
5
From page
797
To page
801
Abstract
TBCs are increasingly susceptible to degradation by airborne CMAS deposits. In order to mitigate the CMAS attack, we fabricated a dense, crack-free alumina overlay for TBCs by electrophoretic deposition (EPD) technique. Overlay coatings of controlled thickness were successfully fabricated for YSZ TBCs, by EPD followed by controlled sintering at 1200 °C. YSZ with alumina overlay coatings were tested for CMAS attack at 1300 °C. Detailed examination of microstructural changes and phase evolution in CMAS tested specimens was performed by X-ray diffraction and electron microscopy. Dense alumina overlay produced by EPD was found to physically suppress the infiltration of CMAS. Furthermore, CMAS was found to crystallize into anorthite (CaAl2Si2O8) and MgAl2O4 spinel by chemically interacting with EPD α-Al2O3. A shift in CMAS glass composition to a crystallizable Al-rich glass composition promoted the formation of anorthite platelets (CaAl2Si2O8) and localized enrichment of Mg promoted the formation of MgAl2O4 spinel. EPD alumina overlay on commercial-production TBCs retained its adhesion and structural integrity after 20 cycles of 1-hour furnace thermal cycle test at 1100 °C.
Keywords
Electrophoretic Deposition , thermal barrier coating , Environmental Degradation , CMAS degradation , Overlay barrier coating
Journal title
Surface and Coatings Technology
Serial Year
2009
Journal title
Surface and Coatings Technology
Record number
1821593
Link To Document