• Title of article

    Interface analysis of inorganic films on polyimide with atomic oxygen exposure

  • Author/Authors

    Huang، نويسنده , , Yongxian and Lv، نويسنده , , Shixiong and Tian، نويسنده , , Xiubo and Fu، نويسنده , , Ricky K.Y and Chu، نويسنده , , Paul K.، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2013
  • Pages
    6
  • From page
    121
  • To page
    126
  • Abstract
    Inorganic silica/alumina multilayer films with excellent mechanical and anti-atomic-oxygen erosion properties were fabricated on polyimide by the hybrid implanting and depositing processes. X-ray photoelectron spectroscopy demonstrated that the silica/alumina graded structures consisted of SiO and AlO bonds, as well as AlOSi and AlOC bonds in the transition layers. The results revealed that bonding between the alumina coating and the polymer occurred primarily via AlOC bonds, and SiOAl bonds were formed in the interface between silica and alumina coatings. The multilayer films presented good adhesion property, demonstrating that balanced internal stresses and alternating bonding structures were crucial for enhancing anti-crack performance. The multilayer inorganic films exhibited good anti-atomic-oxygen erosion properties were well matched with the behavior of adhesion property.
  • Keywords
    Inorganic films , Atomic oxygen , Plasma immersion ion implantation/deposition , erosion , X-ray photoelectron spectroscopy
  • Journal title
    Surface and Coatings Technology
  • Serial Year
    2013
  • Journal title
    Surface and Coatings Technology
  • Record number

    1827186