• Title of article

    Recognition of semiconductor defect patterns using spatial filtering and spectral clustering

  • Author/Authors

    Chih-Hsuan Wang، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2008
  • Pages
    10
  • From page
    1914
  • To page
    1923
  • Keywords
    Defect pattern , Fuzzy clustering , Data mining , Spectral clustering
  • Journal title
    Expert Systems with Applications
  • Serial Year
    2008
  • Journal title
    Expert Systems with Applications
  • Record number

    187004

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=187004