Depth profile analysis of organic multi-layer device with nanometer resolution using surface-enhanced Raman spectroscopy

Information on depth distribution of molecular vibrational modes of an organic multilayer device has been obtained by surface-enhanced Raman scattering (SERS) applied to a low-angle beveled surface which was prepared by gradient shaving preparation. We achieved a depth resolution of nearly 5 nm in terms of the decay length of the organic species at the interfaces. Encapsulation with a glass cap after metal deposition in nitrogen atmosphere gives reproducible SER spectra even at 1-μm range.