Title of article
Clustered defect detection of high quality chips using self-supervised multilayer perceptron
Author/Authors
Chenn-Jung Huang، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2007
Pages
8
From page
996
To page
1003
Keywords
Defect detection , Median filter , Nearest neighbor , Clustering , Neural networks , Probing , Multilayer perceptron
Journal title
Expert Systems with Applications
Serial Year
2007
Journal title
Expert Systems with Applications
Record number
198709
Link To Document