Title of article
Test system for an optical readout chain of a silicon microstrip detector
Author/Authors
Acciarri، نويسنده , , M and Arcesi، نويسنده , , B and Baschirotto، نويسنده , , A and Castello، نويسنده , , R and Furetta، نويسنده , , C and Pensotti، نويسنده , , S and Rancoita، نويسنده , , P.G. and Rattaggi، نويسنده , , M and Redaelli، نويسنده , , M and Seidman، نويسنده , , A، نويسنده ,
Pages
5
From page
427
To page
431
Abstract
A test system, for an optical readout chain of a double-sided silicon microstrip detector, is presented. The system can be used for a quick but complete test of the working performance of the optical readout chain, and for finding exactly the faulty part of the readout chain, in case that an error is detected. It was designed, developed, and built for a silicon microvertex detector used at the LEP collider. A description, of both the hardwave and software of the system, is given. Finally, experimental results, of laboratory tests, are shown.
Journal title
Astroparticle Physics
Record number
1998821
Link To Document