Thermal and structural finite element analysis of water cooled silicon monochromator for synchrotron radiation: comparison of two different cooling schemes

The article describes the results of Finite Element Analysis (FEA) of the first Si monochromator crystal distortions due to Synchrotron Radiation (SR) heat load and consequent analysis of the influence of the distortions on a double crystal monochromator performance. Efficiencies of two different cooling schemes are compared. A thin plate of Si crystal is lying on copper cooling support in both cases. There are microchannels inside the cooling support. In the first model the direction of the microchannels is parallel to the diffraction plane. In the second model the direction of the microchannels is perpendicular to the diffraction plane or in other words, it is a conventional cooling scheme. It is shown that the temperature field along the crystal volume is more uniform and more symmetrical in the first model than in the second (conventional) one.