Spectromicroscopy of interfaces with synchrotron radiation:: multichannel data acquisition

Probed length scales of sub-micrometer dimensions have been achieved in photoemission spectroscopy owing to the high flux and brightness of the soft X-rays provided by the third generation synchrotron sources and the progress in microfabrication of focusing elements for soft X-rays. The use of multichannel detectors in the recently constructed scanning photoelectron microscopes adds speed and flexibility in data acquisition. Here we present some results obtained with the scanning photoemission microscope at ELETTRA illustrating the importance of the multichannel data acquisition for the interpretation of the data.