Single-exposure simultaneous diffraction-enhanced imaging

A new method of acquiring and analyzing diffraction-enhanced images (DEI) is presented. This method has been performed at the National Synchrotron Light Source and is based on using a novel two-crystal analyzer (Laue and Bragg analyzer). This system delivers simultaneously a pair of images with differing refraction sensitivity that is necessary for extracting absorption and refraction information using the DEI method. Although the system is not as flux efficient as a DEI system using a Bragg analyzer, it eliminates problems associated with object motion in between exposures. The system, method of interpreting the results and illustrative examples of experiments are presented and discussed.