• Title of article

    Applying X-rays in material analysis

  • Author/Authors

    Kogan، نويسنده , , Vladimir and Bethke، نويسنده , , Klaus and Vries، نويسنده , , Roelof de، نويسنده ,

  • Pages
    4
  • From page
    290
  • To page
    293
  • Abstract
    This paper presents some applications of X-ray diffraction analysis for the development and quality control of modern semiconductor detectors.
  • Keywords
    X-ray diffraction , Thin films , quality control , Semiconductor materials
  • Journal title
    Astroparticle Physics
  • Record number

    2021058

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=2021058