• Title of article

    Degradation effects in TlBr single crystals under prolonged bias voltage

  • Author/Authors

    Kozlov، نويسنده , , V. and Kemell، نويسنده , , M. and Vehkamنki، نويسنده , , M. and Leskelن، نويسنده , , M.، نويسنده ,

  • Pages
    5
  • From page
    10
  • To page
    14
  • Abstract
    Electrical properties of TlBr purified by hydrothermal annealing in pure water were studied by I–V, capacitance and photocurrent measurements using Ti-electrodes which were deposited by electron-beam evaporation. Time characteristics of the current during the aging were recorded under fixed voltage (0–200 V) at different temperatures 277–353 K. The samples were additionally characterised by the X-ray powder diffraction and rocking curve methods. The degradation of TlBr was studied by scanning electron microscopy (SEM) and energy dispersive X-ray spectrometry (EDS). The composition at the electrode area was observed to be different for the negative and positive sides.
  • Keywords
    Compound semiconductors , TlBr , Ionic current , Electrode degradation
  • Journal title
    Astroparticle Physics
  • Record number

    2028722