Title of article
Systematic effects in some semiconductor detector tests
Author/Authors
Dole?al، نويسنده , , Z. and Drasal، نويسنده , , Z. and Kodys، نويسنده , , P. and Kvasni?ka، نويسنده , , P. and Reznicek، نويسنده , , P. and Scheirich، نويسنده , , D.، نويسنده ,
Pages
5
From page
37
To page
41
Abstract
This paper deals with commonly used semiconductor detector testing methods, i.e. tests with high energy beams, lasers or radioactive beta sources. The systematic effects of the tests are analysed and applicability limits are determined using measurements and simulations.
Keywords
Beam tests , Position-sensitive detectors , Laser tests , Silicon detectors
Journal title
Astroparticle Physics
Record number
2031312
Link To Document