Comparison of experimental and theoretical efficiency of HPGe X-ray detector

The low energy high purity germanium (HPGe) detectors are being increasingly used for the quantitative estimation of elements using X-ray spectrometric techniques. The softwares used for quantitative estimation normally evaluate model based efficiency of detector using manufacturer supplied detector physical parameters. The present work shows that the manufacturer supplied detector parameters for low energy HPGe detectors need to be verified by comparing model based efficiency with the experimental ones. This is particularly crucial for detectors with ion implanted P type contacts.