Title of article
Selected-area diffraction and spectroscopy in LEEM and PEEM
Author/Authors
Tromp، نويسنده , , R.M.، نويسنده ,
Pages
5
From page
73
To page
77
Abstract
This paper addresses the effects of spherical and chromatic aberration of the objective lens, as well as chromatic dispersion of magnetic prism arrays, on the ability to perform selected area Low Energy Electron Diffraction, as well as (Angle Resolved) Photo Electron Spectroscopy experiments in todayʹs advanced cathode lens microscopy instruments.
Keywords
Chromatic aberration , Spherical aberration , Selected area spectroscopy , LEEM , Selected area diffraction , PEEM , dispersion
Journal title
Astroparticle Physics
Record number
2043746
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