Title of article
Electric force microscopy investigation of a MEH-PPV conjugated polymer blend: Robustness or frailty?
Author/Authors
Patrيcio، نويسنده , , P.S.O. and Cury، نويسنده , , L.A. and Silva، نويسنده , , G.G. and Neves، نويسنده , , B.R.A.، نويسنده ,
Pages
7
From page
302
To page
308
Abstract
Electric force microscopy (EFM) was employed in the electrical characterization of a blend of thermoplastic polyurethane (TPU) and poly(2-methoxy-5-(2′-ethyl-hexyloxy)-1,4-phenylenevinylene) (MEH-PPV) conjugated polymer. Although qualitative EFM interpretation is straightforward, its quantitative analysis always relies on approximated models. The extraction of physically reasonable parameters is normally assumed as a proof of validity of the theoretical model employed. In order to gather information about electric properties of this blend and to test the EFM technique itself, two distinct and discordant models were developed in this work to fit experimental EFM data. Even though MEH-PPV is regarded as a conductor in one model and as a dielectric in the other, both models yielded coherent and reasonable electrical properties for this blend. Such unexpected results are used to discuss the robustness or frailty of EFM in the analysis of complex materials.
Keywords
Conductive polymer , Electric Force Microscopy , MEH-PPV , blends
Journal title
Astroparticle Physics
Record number
2046066
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