Photon scanning tunneling microscopy of optical channel waveguides

Photon scanning tunneling microscopy (PSTM) has been used to characterize optical channel waveguides. Both HeNe laser and semiconductor diode laser wavelengths are utilized in the measurement of the evanescent field intensity associated with the propagating modes of optical waveguides. A tapered optical fiber tip, and also a semiconductor heterostructure tip attached to an optical fiber are employed for detection. Local values of effective refractive index are calculated from measurements of both TE and TM polarizations and compared to model calculations.