Title of article
Laser-assisted atom probe analysis of sol–gel silica layers
Author/Authors
Gruber، نويسنده , , M. and Oberdorfer، نويسنده , , C. and Stender، نويسنده , , P. and Schmitz، نويسنده , , G.، نويسنده ,
Pages
6
From page
654
To page
659
Abstract
Semi-conducting nanocrystals embedded in a non-conducting matrix of silicate glass may be used as non-volatile data storage device. Structures of silicate glasses are conveniently produced by a sol–gel process, which offers the possibility to coat tip-shaped substrates with a silica layer. The study presents first results of their local chemical analysis by laser-assisted atom probe. Till date the exact mechanisms of laser pulsing are still controversial. But it is common sense that there is an at least considerable heating effect on the tip, which leads to a short temperature rise and a prolonged cooling period in materials of low heat conductivity. This effect alters the shape of mass peaks and is examined here using a one-dimensional model of heat transport.
Keywords
Sol–gel process , Atom probe tomography , Laser pulsing , silica
Journal title
Astroparticle Physics
Record number
2049541
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