Title of article
SimulaTEM: Multislice simulations for general objects
Author/Authors
Gَmez-Rodrيguez، نويسنده , , A. and Beltrلn-del-Rيo، نويسنده , , L.M. and Herrera-Becerra، نويسنده , , R.، نويسنده ,
Pages
10
From page
95
To page
104
Abstract
In this work we present the program SimulaTEM for the simulation of high resolution micrographs and diffraction patterns. This is a program based on the multislice approach that does not assume a periodic object. It can calculate images from finite objects, from amorphous samples, from crystals, quasicrystals, grain boundaries, nanoparticles or arbitrary objects provided the coordinates of all the atoms can be supplied.
Keywords
Electron diffraction , Multislice , High resolution electron microscopy , image simulation
Journal title
Astroparticle Physics
Record number
2049906
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