• Title of article

    Reply to comment by Maurice et al. in response to “Bragg’s Law Diffraction Simulations for Electron Backscatter Diffraction Analysis”

  • Author/Authors

    Kacher، نويسنده , , Josh and Basinger، نويسنده , , Jay L. Adams ، نويسنده , , Brent L. and Fullwood، نويسنده , , David T.، نويسنده ,

  • Pages
    3
  • From page
    760
  • To page
    762
  • Abstract
    A reply to Maurice et al.ʹs comment on "Braggʹs Law Diffraction Simulations for Electron Backscatter Diffraction" is presented. A new method for microscope geometry calibration is briefly presented. Also, evidence that simple diffraction simulations can be profitable tools for absolute elastic strain measurements in crystalline materials is reiterated.
  • Keywords
    EBSD , strain , Scanning electron microscope
  • Journal title
    Astroparticle Physics
  • Record number

    2050157

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=2050157