Title of article
Electron localization in granular materials
Author/Authors
Dumpich، نويسنده , , G. and Carl، نويسنده , , A. and Mikitisin، نويسنده , , P.، نويسنده ,
Pages
5
From page
353
To page
357
Abstract
We have investigated the structural and electrical properties of granular Pd/C as well as granular Au/C thin firms. As revealed by transmission electron microscopy the films consist of small metallic clusters of either Pd or Au embedded within amorphous carbon. Films with low metal volume fraction x consist of structurally isolated clusters and show exponential resistance behavior. Above the so-called percolation threshold xp metallic clusters form a percolating network rendering metallic conductivity. For metallic films with x ≫ xp we observe two dimensional (2d) electronic transport behavior at low temperatures via small additional contributions to the Boltzmann-resistance as arising from weak electron localization (WEL) and enhanced electron-electron interaction (EEI). When approaching the percolation threshold these additional resistance contributions grow in absolute magnitude and the 2d transport behavior changes to 3d-behavior close to xp. For both cases resistance as well as magnetoresistance data can be well explained using theories for WEL and EEI in 2d and 3d respectively.
Keywords
Transmission electron microscopy , Percolation threshold , granular materials
Journal title
Astroparticle Physics
Record number
2050977
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