Title of article
Semi-insulating properties control by cvd process modelling
Author/Authors
Cordier، نويسنده , , C. and Dehan، نويسنده , , E. and Scheid، نويسنده , , E. and Duverneuil، نويسنده , , P.، نويسنده ,
Pages
5
From page
30
To page
34
Abstract
SIPOS films were deposited from a mixture of disilane and nitrous oxide in a tubular hot wall reactor and their thickness and oxygen content were measured. A detailed chemical mechanism is proposed to represent homogeneous and heterogeneous reactions and the CVD2 model taking into account hydrodynamics and mass transfer with chemical reactions is adjusted to SIPOS deposition. A good agreement between experimental results and model predictions for various operating conditions is obtained. By the use of CVD2 model, the main chemical pathways are identified and an extensive comprehension of the experimental evidences is possible.
Keywords
Silicon oxide , Deposition , Modelisation , Silicon
Journal title
Astroparticle Physics
Record number
2063835
Link To Document