Electrical measurements on submicronic synthetic conductors: carbon nanotubes

The synthesis of very small samples has raised the need for a drastic miniaturization of the classical four-probe technique in order to realize electrical resistance measurements. Two methods to realize electrical contacts on very small fibers are described here. Using classical photolithography the electrical resistivity of a submicronic catalytic chemical vapour deposited filament is estimated. Scanning tunneling microscopy (STM) lithography allowed to attach small gold contacts to a small bundle (diameter 50 nm) of carbon nanotubes. This bundle is found to exhibit a semimetallic behavior at higher temperature and an unexpected drop of the electrical resistivity at lower temperature.