• Title of article

    Electro-optic measurement of Langmuir-Blodgett films layered with N-docosylquinolinium-TCNQ

  • Author/Authors

    Shin، نويسنده , , Dong-Myung and Choi، نويسنده , , Kang-Hoon and Kang، نويسنده , , Dou-Yol and Kim، نويسنده , , Tae Wan and Choi، نويسنده , , Dong Hoon، نويسنده ,

  • Issue Information
    دوماهنامه با شماره پیاپی سال 1995
  • Pages
    2
  • From page
    2093
  • To page
    2094
  • Abstract
    Electro-optic coefficient, refractive index and dielectric dispersion for the Langmuir-Blodgett (LB) films of N-docosylquinolinium-TCNQ were obtained. The thickness of one layer of the LB film was 38.14Å at the surface pressure of 30mN/m, and the refractive index calculated from spectroscopic ellipsometry was 1.2∼1.3. The dielectric dispersion shows the frequency dependence of the orientational polarization and the resonance frequency, fr, was about 1.5kHz in the film. The electro-optic effect for the LB film were measured from the simple reflection technique. Suprisingly large electro-optic coefficient, 98.7∼69.3pm/V, were obtained.
  • Journal title
    Synthetic Metals
  • Serial Year
    1995
  • Journal title
    Synthetic Metals
  • Record number

    2069697