Title of article
Mass spectrometric characterization of ablated thin polybithiophene films using photoionization
Author/Authors
Sauerland، نويسنده , , Volker and Schindler، نويسنده , , Ralph N.، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 1995
Pages
4
From page
191
To page
194
Abstract
Thin electrochemically generated polybithiophene film material was CO2-laser ablated from the electrode, transported into the ion source of a time-of-flight mass spectrometer by an expanding Ar jet, and photoionized using a dye laser in the range 240 < λ < 252 nm. The spectra obtained are dominated by strong contributions from oligomers, especially ions containing six or eight thiophene units. The identity of the starting 2,2′-bithienyl monomer is clearly preserved in the ablated oligomers. Ion distributions are affected by the supporting electrolyte used during polymerization and by the charge passed through the electrode.
Keywords
Photoionization , Polybithiophene , Spectroscopy , films
Journal title
Synthetic Metals
Serial Year
1995
Journal title
Synthetic Metals
Record number
2069868
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