Title of article
A study on the electrical switching mechanism in [TBA]x[Ni(dmid)2] thin film materials by XPS
Author/Authors
Liu، نويسنده , , Sheng-Gao and Liu، نويسنده , , Yunqi and Zhu، نويسنده , , Dao-Ben، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 1997
Pages
2
From page
2265
To page
2266
Abstract
A study on the electrical switching mechanism in [TBA]x[Ni(dmid)2] thin film materials, in which reproducible current-controlled bistable electrical switching and memory phenomena could be observed [1], by X-ray photoelectron spectroscopy (XPS) was reported. The effects of fabrication electrodes and preparation conditions of the sandwich structure devices on the switching behavior were presented as well.
Keywords
Photoelectron spectroscopy , Switches
Journal title
Synthetic Metals
Serial Year
1997
Journal title
Synthetic Metals
Record number
2071372
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