• Title of article

    Degradation of polymer-based light-emitting diodes during operation

  • Author/Authors

    Ettedgui، نويسنده , , E. and Davis، نويسنده , , G.T. and Hu، نويسنده , , B. and Karasz، نويسنده , , F.E.، نويسنده ,

  • Issue Information
    دوماهنامه با شماره پیاپی سال 1997
  • Pages
    4
  • From page
    73
  • To page
    76
  • Abstract
    Segmented block copolymers consisting of conjugated-nonconjugated sequences are useful chromophores in polymer LEDs and can lead to efficient devices of high luminance. The lifetime of such diodes depends on numerous chemical and physical interactions. Some of these pertaining to the chromophore/electrode interface can be usefully studied by optical and various electron microscopies. In typical diodes studied here, failure is associated inter alia with irregularities in the spin-coated polymer films. Atomic force microscopy provides a more detailed examination of the morphology of the polymer films.
  • Keywords
    light-emitting diodes , Scanning electron microscopy , electrodes , atomic force microscopy , Poly(phenylene vinylene) derivatives
  • Journal title
    Synthetic Metals
  • Serial Year
    1997
  • Journal title
    Synthetic Metals
  • Record number

    2071571