Title of article
AFM studies of polypyrrole film surface morphology I. The influence of film thickness and dopant nature
Author/Authors
Silk، نويسنده , , Toomas and Hong، نويسنده , , Qi and Tamm، نويسنده , , Jüri and Compton، نويسنده , , Richard G.، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 1998
Pages
6
From page
59
To page
64
Abstract
In this paper the surface morphology of electrogenerated polypyrrole films of various thicknesses and dopant anions (chloride, sulfate, perchlorate and dodecylsulfate) as studied by atomic force microscopy under ex situ conditions is reported. The roughness characteristics of the film surface are determined and discussed.
Keywords
Polypyrrole , atomic force microscopy , surface morphology , Dopant influence , Film Thickness
Journal title
Synthetic Metals
Serial Year
1998
Journal title
Synthetic Metals
Record number
2071744
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