Title of article
Scanning Kelvin probe and photoemission electron microscopy of organic source-drain structures
Author/Authors
Müller، نويسنده , , K. and Goryachko، نويسنده , , A. and Burkov، نويسنده , , Y. and Schwiertz، نويسنده , , C. and Ratzke، نويسنده , , M. and Kِble، نويسنده , , Z. Sun and J. H. Reif، نويسنده , , J. and Schmeiكer، نويسنده , , D.، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2004
Pages
6
From page
377
To page
382
Abstract
In order to optimize organic field effect transistors (OFETs), the characterisation of active-layer surfaces in terms of their roughness, chemical composition and distribution of surface potentials is important. We report on high-resolution microscopic ma
Keywords
Scanning Kelvin probe microscopy (SKPM) , OFET , Photoemission electron microscopy (PEEM)
Journal title
Synthetic Metals
Serial Year
2004
Journal title
Synthetic Metals
Record number
2080968
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