Title of article
Molecular orientation in ultrathin films of α-sexithiophene on silicon dioxide revealed by spatially resolved confocal spectroscopy
Author/Authors
Da Como، نويسنده , , Enrico and Loi، نويسنده , , Maria Antonietta and Dinelli، نويسنده , , Franco and Murgia، نويسنده , , Mauro and Biscarini، نويسنده , , Fabio and Zamboni، نويسنده , , Roberto and Muccini، نويسنده , , Michele، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2005
Pages
4
From page
287
To page
290
Abstract
In organic semiconductors devices like thin film transistors (TFTs), the supra-molecular organization on the substrate is one of the most important parameters to control the charge transport. Unprecedented insights into the molecular orientation of vacuum sublimed ultrathin films of α-sexithiophene (T6) on silicon dioxide are revealed by confocal laser scanning microscopy (CLSM) and spectroscopy. By the cross correlation of confocal microscopy and atomic force microscopy measurements, we demonstrated that in films thinner than 2 nm, regions where molecules are oriented perpendicular to the substrate and regions where molecules are parallel to the substrate co-exist. By spatially resolved spectroscopy, we gain information about the supra-molecular organization in ultrathin films. Implications for charge transport in thin film transistors are considered and discussed.
Keywords
confocal microscopy , Photoluminescence , atomic force microscopy , Sexithiophene , Thin film
Journal title
Synthetic Metals
Serial Year
2005
Journal title
Synthetic Metals
Record number
2082664
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