Title of article
Mechanical characterization of PEDOT:PSS thin films
Author/Authors
Lang، نويسنده , , Udo and Naujoks، نويسنده , , Nicola and Dual، نويسنده , , Jurg، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2009
Pages
7
From page
473
To page
479
Abstract
By tensile testing the mechanical properties of thin films of the intrinsically conductive poly(3,4-ethylenedioxythiophene) poly(styrene sulfonate) (PEDOT:PSS) under different relative humidities are investigated. It can be shown that the fracture behaviour strongly depends on humidity and reaches from brittle to plastic. The fracture surfaces are first investigated by scanning electron microscopy (SEM). The surfaces change from smooth at 23% rH to rough with shear lips for samples tested at 55% rH. Atomic force microscopy then reveals the topography of fracture surfaces at the nanometer scale and thus gives insights into the morphology of PEDOT:PSS thin films. By combining the experimental findings of the tensile tests and the AFM scans a micromechanical model for the deformation behavior of PEDOT:PSS can then be derived.
Keywords
PEDOT:PSS , Thin film , Tensile tests , Young’s modulus , AFM , Mechanical behaviour , morphology
Journal title
Synthetic Metals
Serial Year
2009
Journal title
Synthetic Metals
Record number
2084812
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