• Title of article

    The origin of hole injection improvements with MoO3/Al bilayer electrodes in pentacene thin-film transistors

  • Author/Authors

    Jeon، نويسنده , , Pyungeun and Han، نويسنده , , Kyul and Lee، نويسنده , , Hyunbok and Kim، نويسنده , , Hyun Sung and Jeong، نويسنده , , Kwangho and Cho، نويسنده , , Kwanghee and Cho، نويسنده , , Sang Wan and Yi، نويسنده , , Yeonjin، نويسنده ,

  • Issue Information
    دوماهنامه با شماره پیاپی سال 2009
  • Pages
    4
  • From page
    2502
  • To page
    2505
  • Abstract
    The electronic structures of pentacene/MoO3/Al and pentacene/Al were studied using in situ photoemission spectroscopy. The secondary electron cutoffs, highest occupied molecular orbitals (HOMOs) and core level changes were measured upon deposition of the pentacene and MoO3 to study the electronic structures at the interface. We obtained complete energy level diagrams for each interface, showing that the insertion of the MoO3 layer between pentacene and Al induces the HOMO level shift of pentacene toward lower binding energies compared to that without MoO3. This results in reduction of the hole injection barrier, which is responsible for the improvements in electronic device performance.
  • Keywords
    Electronic structure , UPS , XPS , AL , injection barrier , pentacene , MoO3
  • Journal title
    Synthetic Metals
  • Serial Year
    2009
  • Journal title
    Synthetic Metals
  • Record number

    2086516