Title of article
Ellipsometric study on the optical property of UV exposed MEH-PPV polymer film
Author/Authors
Jung، نويسنده , , Y.W. and Byun، نويسنده , , J.S. and Cha، نويسنده , , David Y.H. and Kim، نويسنده , , Y.D.، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2010
Pages
4
From page
651
To page
654
Abstract
We performed ellipsometric analysis on the effect of Ultra-Violet (UV) light exposure to the poly(2-methoxy-5-(2′-ethyl-hexyloxy)-p-phenylenevinylene) (MEH-PPV) films. The measured dielectric function spectrum of the MEH-PPV film showed the consistent decrease of absorption coefficients with the UV light exposure time, especially at the ordinary axis. This work notes that UV light protection method should be included in the process of MEH-PPV films for the optical device applications to prevent the significant change of optical property of the film and to maintain its efficient absorption of sunlight for solar cell devices.
Keywords
Anisotropy , solar cell , Optical property , ellipsometry , MEH-PPV
Journal title
Synthetic Metals
Serial Year
2010
Journal title
Synthetic Metals
Record number
2086986
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