Title of article
Studies of monolayers using synchrotron X-ray diffraction
Author/Authors
Dutta، نويسنده , , Pulak، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1997
Pages
6
From page
557
To page
562
Abstract
Diffraction of synchrotron X-rays is a powerful tool for studies of monolayers. In recent years, the emphasis of such studies has moved from physisorbed monolayers of rare gases or small molecules, to more extended molecules physisorbed or chemisorbed on liquid and solid surfaces. Diffraction studies of self-assembled and Langmuir films, successfully performed only during the past ten years, have dramatically increased our understanding of these scientifically and technologically important monolayer systems.
Journal title
Current Opinion in Solid State and Materials Science
Serial Year
1997
Journal title
Current Opinion in Solid State and Materials Science
Record number
2088278
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