• Title of article

    Studies of monolayers using synchrotron X-ray diffraction

  • Author/Authors

    Dutta، نويسنده , , Pulak، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1997
  • Pages
    6
  • From page
    557
  • To page
    562
  • Abstract
    Diffraction of synchrotron X-rays is a powerful tool for studies of monolayers. In recent years, the emphasis of such studies has moved from physisorbed monolayers of rare gases or small molecules, to more extended molecules physisorbed or chemisorbed on liquid and solid surfaces. Diffraction studies of self-assembled and Langmuir films, successfully performed only during the past ten years, have dramatically increased our understanding of these scientifically and technologically important monolayer systems.
  • Journal title
    Current Opinion in Solid State and Materials Science
  • Serial Year
    1997
  • Journal title
    Current Opinion in Solid State and Materials Science
  • Record number

    2088278