Title of article
Methods in determination of morphological degradation of polymer:fullerene solar cells
Author/Authors
Turkovic، نويسنده , , Vida and Engmann، نويسنده , , Sebastian and Gobsch، نويسنده , , Gerhard and Hoppe، نويسنده , , Harald، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2012
Pages
6
From page
2534
To page
2539
Abstract
The changes in the blend morphology of the thin films accelerate when thermally annealed at increased temperatures. Tapping-mode atomic force microscopy (AFM) measurements provide deeper insight into the nano- and micro-meter scale of the phase separation observable on the surface of the film. Furthermore, to prove the coarsening of phase separation on various length scales, optical microscopy, UV–Vis, photoluminescence and measurements were conducted. Of special interest is tracking down the formation of fullerene aggregates and correlation of their growth in time. We demonstrate ways to detect characteristic stages of phase separation directly using simple optical measurements.
Keywords
Degradation , atomic force microscopy , PCBM , P3HT , Bulk heterojunction , UV–vis spectroscopy , Optical microscopy , morphology , Photoluminescence , Thermal annealing
Journal title
Synthetic Metals
Serial Year
2012
Journal title
Synthetic Metals
Record number
2088481
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