• Title of article

    Methods in determination of morphological degradation of polymer:fullerene solar cells

  • Author/Authors

    Turkovic، نويسنده , , Vida and Engmann، نويسنده , , Sebastian and Gobsch، نويسنده , , Gerhard and Hoppe، نويسنده , , Harald، نويسنده ,

  • Issue Information
    دوماهنامه با شماره پیاپی سال 2012
  • Pages
    6
  • From page
    2534
  • To page
    2539
  • Abstract
    The changes in the blend morphology of the thin films accelerate when thermally annealed at increased temperatures. Tapping-mode atomic force microscopy (AFM) measurements provide deeper insight into the nano- and micro-meter scale of the phase separation observable on the surface of the film. Furthermore, to prove the coarsening of phase separation on various length scales, optical microscopy, UV–Vis, photoluminescence and measurements were conducted. Of special interest is tracking down the formation of fullerene aggregates and correlation of their growth in time. We demonstrate ways to detect characteristic stages of phase separation directly using simple optical measurements.
  • Keywords
    Degradation , atomic force microscopy , PCBM , P3HT , Bulk heterojunction , UV–vis spectroscopy , Optical microscopy , morphology , Photoluminescence , Thermal annealing
  • Journal title
    Synthetic Metals
  • Serial Year
    2012
  • Journal title
    Synthetic Metals
  • Record number

    2088481