Title of article
Photoelectron spectroscopy and microscopy of carbon nanotubes
Author/Authors
Suzuki، نويسنده , , Satoru and Watanabe، نويسنده , , Yoshio and Heun، نويسنده , , Stefan، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2006
Pages
7
From page
53
To page
59
Abstract
In this review we will focus our attention on the characterization of carbon nanotubes by X-ray photoelectron spectroscopy. In contrast to other spectroscopic techniques, photoelectron spectroscopy allows to obtain information on the overall electronic structure of the sample in a wide energy range, which makes it a unique technique. We will discuss the most recent and the most significant results on the intrinsic electronic properties of carbon nanotubes obtained with photoelectron spectroscopy. Furthermore, we will discuss in detail the application of photoelectron microscopy, i.e. photoelectron spectroscopy with high lateral resolution, to the study of carbon nanotubes. This technique allows to obtain laterally resolved spectroscopic information from ensembles of carbon nanotubes, but it even allows to perform photoelectron spectroscopy on single carbon nanotubes.
Keywords
Carbon nanotubes , X-Ray Photoelectron Spectroscopy (XPS) , Scanning photoelectron microscopy (SPEM) , Photoemission electron microscopy (PEEM)
Journal title
Current Opinion in Solid State and Materials Science
Serial Year
2006
Journal title
Current Opinion in Solid State and Materials Science
Record number
2089085
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