Title of article
Processing dependences of microstructure of ferroelectric thin films
Author/Authors
Haiyan، نويسنده , , He، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2008
Pages
7
From page
19
To page
25
Abstract
Ferroelectric thin film has been widely investigated in detail in recent years. The ferroelectric properties of thin films are obviously dependent on the microstructure of the film, which is influenced by some processing parameters for preparing the films, including precursor solution chemistry, nature of substrate, film thickness, and condition of heat treatment etc. In this paper, these processing dependences of the films are reviewed.
Keywords
Thin film , microstructure , Processing effect , orientation , ferroelectricity
Journal title
Current Opinion in Solid State and Materials Science
Serial Year
2008
Journal title
Current Opinion in Solid State and Materials Science
Record number
2089152
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