Title of article
X-ray diffraction at elevated temperatures: A method for in situ process analysis: By D. D. L. Chung, P. W. DeHaven, H. Arnold, and Debashis Ghosh. VCH Publishers, New York, 1993, 268 pages, price $95
Author/Authors
Nassau، نويسنده , , Kurt، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1996
Pages
2
From page
245
To page
246
Journal title
Materials Research Bulletin
Serial Year
1996
Journal title
Materials Research Bulletin
Record number
2093086
Link To Document