Title of article
Electrical characterization and type conversion in N+ irradiated CdS thin films prepared by chemical bath deposition
Author/Authors
Narayanan، نويسنده , , K.L and Rajaraman، نويسنده , , R and Valsakumar، نويسنده , , M.C and Nair، نويسنده , , K.G.M and Vijayakumar، نويسنده , , K.P، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
6
From page
1729
To page
1734
Abstract
Type conversion due to nitrogen ion irradiation in CdS thin films prepared by chemical bath deposition (CBD) is reported. The films were bombarded with various doses of nitrogen ions in the range 1014–1017 ions/cm2, at an energy of 130 keV. The electrical conductivity of the films was found to increase with increase in nitrogen ion concentration. The temperature dependence of conductivity showed an activation energy of 0.06 eV, indicating shallow level formation due to implantation. Hot-probe measurements revealed p-type conductivity in implanted samples and n-type conductivity in unirradiated samples. X-ray diffraction results revealed CdS to be the predominant phase even after nitrogen ion irradiation.
Keywords
A. Chalcogenides , A. Thin films , B. Chemical synthesis , D. Electrical properties , A. Semiconductors
Journal title
Materials Research Bulletin
Serial Year
1999
Journal title
Materials Research Bulletin
Record number
2094555
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