Title of article
X-ray diffraction topography investigation of the core in Bi12SiO20 crystals
Author/Authors
Milenov، نويسنده , , Teodor I and Rafailov، نويسنده , , Peter M and Botev، نويسنده , , Pavel A and Gospodinov، نويسنده , , Marin M، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
8
From page
1651
To page
1658
Abstract
The core in a large Bi12SiO20 crystal as well as the regions free of optical inhomogenities was examined by X-ray double-crystal diffraction topography. It was established that the observed defects in the central core are two-dimensional. The absorption of some impurities as well as the composition changes observed in this area by other authors, should be considered as a consequence of the formation of these defects.
Keywords
D. Defects , A. Oxides , C. X-ray diffraction
Journal title
Materials Research Bulletin
Serial Year
2002
Journal title
Materials Research Bulletin
Record number
2095900
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