Title of article
X-ray diffraction and Raman scattering in SbSI nanocrystals
Author/Authors
Gomonnai، نويسنده , , A.V. and Voynarovych، نويسنده , , I.M. and Solomon، نويسنده , , A.M. and Azhniuk، نويسنده , , Yu.M. and Kikineshi، نويسنده , , A.A. and Pinzenik، نويسنده , , V.P. and Kis-Varga، نويسنده , , M. and Daroczy، نويسنده , , L. and Lopushansky، نويسنده , , V.V.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
6
From page
1767
To page
1772
Abstract
Lattice structure and rod-like shaped SbSI nanocrystals obtained by ball milling with rod thickness down to 70 nm, as estimated from X-ray diffraction (XRD) and electron microscopy, is similar to that of the bulk crystals. The dependence of the grain size on the milling duration is discussed in view of the chain-like crystalline structure of SbSI. Possible factors, responsible for the observed Raman line broadening, are discussed, scattering by surface phonons being considered the predominant one.
Keywords
C. Raman spectroscopy , C. X-ray diffraction , A. Nanostructures , A. Inorganic compounds
Journal title
Materials Research Bulletin
Serial Year
2003
Journal title
Materials Research Bulletin
Record number
2096498
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