Electrical characterization of single-walled carbon nanotubes with Scanning Force Microscopy

In this work, a study of the possibilities of the Scanning Force Microscope (SFM) for studying transport properties of carbon nanotubes (CNTs) was done. Single-walled carbon nanotubes were deposited on SiO2. Afterwards, using a mask, the surface was covered with gold, so that some of the carbon nanotubes in the surface stick out underneath the gold. In those areas, topographies and electrical measurements with metallic cantilevers have been carried out. We have developed simultaneous force vs. distance and current vs. distance data along the uncovered length of the nanotubes. In addition, current vs. voltage data was acquired at the maximum loading force during the indentation process. We found that the current rises abruptly when the tip touches the carbon nanotube and it is compared with similar experiments on the gold surface by the carbon nanotube.